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Enabling Focused Ion Beam Sample Preparation for Application in Reverse Tip Sample Scanning Probe Microscopy

P. Lagrain, K. Paulussen,E. Grieten,G. van den Bosch,S. Rachidi,D. Yudistira,L. Wouters,T. Hantschel

Micro and Nano Engineering（2024）

Cited 1|Views2
Key words
Focused ion beam,FIB/SEM,Dual-beam,Electrical SPM,SSRM,C-AFM,Sample preparation,Reverse tip sample SPM
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