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Millisecond X-ray Reflectometry and Neural Network Analysis: Unveiling Fast Processes in Spin Coating

David Schumi-Marecek,Florian Bertram,Petr Mikulik, Devanshu Varshney,Jiri Novak,Stefan Kowarik

JOURNAL OF APPLIED CRYSTALLOGRAPHY（2024）

Cited 0|Views9
Key words
X-ray reflectometry,spin coating,neural network analysis,X-ray reflectometry,millisecond XRR
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