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Research on Proton Displacement Damage Effects in Charge-Domain Accumulation Type TDI CMOS Image Sensors

Yi Jiang,Lin Wen,Jie Feng,Zitao Zhao,Zhikang Yang, Changsong Shi,Rui Li,Yudong Li,Dong Zhou,Qi Guo

RADIATION EFFECTS AND DEFECTS IN SOLIDS（2024）

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Key words
TDI CIS,displacement damage effect,dark current,CTE,annealing
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