Fast-neutron Soft-Error Tolerance Experimentation with a Radiation-Hardened Optically Reconfigurable Gate Array
2024 IEEE International Conference on Consumer Electronics (ICCE)（2024）
Key words
Gate Array,Reconfigurable Array,Soft-error Tolerance,Nuclear Power Plant,Tolerance Experiments,Internal Operations,Internal Modes,Neutron Energy,Logic Blocks,Tohoku University
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