Analysis of Total Ionizing Dose Effects Using Electron Holography

C. T. Chang,P. Apsangi,K. Muthuseenu,A. Privat, B. Kennedy,M. R. Mccartney, D. J. Smith,K. E. Holbert,H. J. Barnaby

IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）

Cited 0|Views10

Key words

Electric potential,Holography,Semiconductor device measurement,Capacitance-voltage characteristics,Electrostatics,Charge measurement,Performance evaluation,Capacitors,electron holography,electrostatic potential,gamma-ray,metal-oxide-semiconductor (MOS),phase,radiation effects,total ionizing dose (TID)

AI Read Science

Must-Reading Tree

Example

Generate MRT to find the research sequence of this paper

Chat Paper

Summary is being generated by the instructions you defined