Analysis of Efficiency and Utilization with SRAM Dosimetry for Single-Event Effect Evaluation under Irradiation
2022 22ND EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, RADECS（2022）
Key words
quantitative correction factor (Qcrit_eff) ratio,dosimeter,single event effects (SEE),single event upset (SEU),static random access memory (SRAM),SiC power diode
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