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Integrated Analysis of Topographically High Mafic Exposures at Apollo-17 Landing Site Using Data from Imaging Sensors of Chandrayaan-1

Prakash Chauhan, Neeraj Srivastava, C. M. Pieters, Hari Prakash, Annamalai Senthil Kumar,R. R. Navalgund, J. W. Head, N. E. Petro,C. Runyon,J. N. Goswami

Lunar and Planetary Science Conference（2010）

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