On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICs
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）
关键词
Photoconductivity,Capacitors,Measurement techniques,Current measurement,Built-in self-test,Semiconductor device measurement,Radiation effects,Application-specific integrated circuits (ASICs),built-in self-test (BIST),emulation,mixed analog-digital integrated circuits (ICs),radiation detector circuits,radiation effects,radiation hardening (electronics),sampled data circuits,signal generators,silicon-on-insulator (SOI)
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要