Characterization and Setting of Fast Multiplexing Readout Electronics for a Multicell Silicon Drift Detector Used in X-Ray Spectroscopy
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）
Key words
Application-specific integrated circuit (ASIC),high-time resolution spectroscopy (HTRS),pile-up rejection (PUR),readout electronics,silicon drift detector (SDD),X-ray spectroscopy
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