Absolute Doubly Differential Angular Sputtering Yields for 20 Kev Kr+ on Polycrystalline Cu
Caixia Bu,Liam S. Morrissey,Benjamin C. Bostick,Matthew H. Burger, Kyle P. Bowen,Steven N. Chillrud,Deborah L. Domingue,Catherine A. Dukes,Denton S. Ebel,George E. Harlow,Pierre-Michel Hillenbrand, Dmitry A. Ivanov,Rosemary M. Killen,James M. Ross, Daniel Schury,Orenthal J. Tucker,Xavier Urbain, Ruitian Zhang,Daniel W. Savin JOURNAL OF APPLIED PHYSICS（2024）
关键词
Secondary Ion Mass Spectrometry
AI 理解论文
溯源树
样例
