Recent Progress in Extreme Environment Durable SiC JFET-R Integrated Circuit TechnologyPhilip G. Neudeck,David J. Spry,Michael J. Krasowski,Carl W. Chang,José M. Gonzalez,Srihari Rajgopal,Norman F. Prokop,Lawrence C. Greer,Dorothy Lukco, Shamir Maldonado-Rivera, Christina M. AdamsIMAPSource Proceedings（2023）引用 1|浏览5关键词High-Temperature ElectronicsAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
