Influence of Gate-Source/Drain Overlap on FefetsChangha Kim,Dong-Oh Kim,Woo Young ChoiSolid-State Electronics(2024)引用 1|浏览2关键词FeFET,MFMIS,Ferroelectric devices,OverlapAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要