A Tabletop X-Ray Tomography Instrument for Nanometer-Scale Imaging: Integration of a Scanning Electron Microscope with a Transition-Edge Sensor Spectrometer Nathan Nakamura , Paul Szypryt , Amber L. Dagel , Bradley K. Alpert , Douglas A. Bennett , W. B. Doriese , Malcolm Durkin , Joseph W. Fowler , Dylan T. Fox , Johnathon D. Gard , Ryan N. Goodner , J. Zachariah Harris , G. C. Hilton , Edward S. Jimenez , Burke L. Kernen , Kurt W. Larson , Zachary H. Levine , Daniel McArthur , Kelsey M. Morgan , Galen C. O’Neil , Nathan J. Ortiz , Christine G. Pappas , C. D. Reintsema , Daniel R. Schmidt , P. A. Schulz , Kyle R. Thompson , Joel N. Ullom , Leila R. Vale , Courtenay T. Vaughan , Christopher J. Walker , Joel C. Weber , Jason Wheeler , Daniel S. Swetz openalex（2022）
关键词
Scanning Electron Microscopy, Environmental Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Transition-Edge Sensors
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