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Automated Grain Boundary Detection for Bright-Field Transmission Electron Microscopy Images Via U-Net.

Matthew J. Patrick,James K. Eckstein, Javier R. Lopez, Silvia Toderas, Sarah A. Asher, Sylvia Whang,Stacey Levine,Jeffrey M. Rickman,Katayun Barmak

MICROSCOPY AND MICROANALYSIS(2023)

Cited 2|Views15
Key words
automated grain boundary detection,bright-field transmission electron microscopy,grain size distribution,machine learning,nanocrystalline thin films
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