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High-resolution Ptychographic Imaging at a Seeded Free-Electron Laser Source Using OAM Beams

Matteo Pancaldi,Francesco Guzzi,Charles S. Bevis,Michele Manfredda,Jonathan Barolak,Stefano Bonetti,Iuliia Bykova,Dario De Angelis,Giovanni De Ninno,Mauro Fanciulli,Luka Novinec,Emanuele Pedersoli,Arun Ravindran,Benedikt Rosner,Christian David,Thierry Ruchon,Alberto Simoncig,Marco Zangrando,Daniel E. Adams,Paolo Vavassori,Maurizio Sacchi,George Kourousias,Giulia F. Mancini,Flavio Capotondi

OPTICA（2024）

Cited 7|Views30
Key words
Free-Electron Lasers,Ptychography,High-Power Lasers,Electron Beams,Nanoscale Imaging
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