Utilizing Response Time for Item Selection in On‐the‐Fly Multistage Adaptive Testing for PISA Assessment
Journal of Educational Measurement（2024）
关键词
Delay Fault Testing,System-on-a-Chip Test,Test Access Architecture,Low-Power Testing
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要