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Microbolometer Bad Pixel and Cluster Definitions Through Defect Observations

Stephen D. Burks,David P. Haefner,Brian P. Teaney, Colin Rakes, Gerald C. Holst

INFRARED IMAGING SYSTEMS DESIGN, ANALYSIS, MODELING, AND TESTING XXXIV(2023)

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关键词
under-sampled imaging systems,defective pixels,uncooled microbolometers,thermal imaging
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