VNA-Based Material Characterization in THz Domain Without Classic Calibration and Time-Gating
2020 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM)（2020）
Key words
Material characterization,parameter extraction,VNA time-gating,RF metrology,measurement uncertainty
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined