Efficacy of Spatial and Temporal RHBD Techniques at Advanced Bulk FinFET Technology Nodes
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2023）
Key words
Single event upsets,Transistors,Delays,FinFETs,Alpha particles,Threshold voltage,Latches,Alpha particles,collected charge,critical charge,feedback loop delay,FinFET,heavy ions,radiation-hardened-by-design (RHBD),scaling,single-event transient (SET) pulse-width,single-event upset (SEU)
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