Characterization and Modeling of DCR and DCR Drift Variability in SPADs
2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS（2023）
关键词
Single-Photon Avalanche Diode (SPAD),Dark Count Rate (DCR),device-to-device variability,reliability,device modeling,Monte-Carlo approach,defects,thermal activation energy
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要