Proton Direct Ionization in Sub-Micron Technologies: Test Methodologies and Modeling
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2023）
Key words
Protons,Particle beams,Lattices,Radiation effects,Performance evaluation,Random access memory,Sensitivity,Degraded high-energy protons (DHEPs),heavy ions (HIs),numerical fitting,proton direct ionization (PDI),rectangular parallelepiped (RPP),single event upset (SEU),soft error rate (SER)
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