Noise Optimization for MKIDs with Different Design Geometries and Material Selections

Z. Pan,K. R. Dibert,J. Zhang,P. S. Barry,A. J. Anderson,A. N. Bender,B. A. Benson,T. Cecil,C. L. Chang,R. Gualtieri,J. Li,M. Lisovenko,V. Novosad,M. Rouble,G. Wang,V. Yefremenko

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY（2023）

引用 3|浏览112

关键词

Detectors,Inductors,Geometry,Temperature measurement,Capacitors,Optical resonators,Aluminum,Generation-recombination noise,noise,microwave kinetic inductance detectors (MKIDs),optimization,two-level system (TLS)

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