DeepMIM: Deep Supervision for Masked Image Modeling
IEEE/CVF Winter Conference on Applications of Computer Vision（2025）
Key words
Masked Images,Deep Supervision,Image Classification,Object Detection,Semantic Segmentation,Meaningful Representation,Shallow Layers,Intermediate Features,Residual Connection,Top-1 Accuracy,Vision Transformer,Including Image Classification,Validation Set,Computer Vision,Range Of Models,Training Loss,Intermediate Layer,Consistent Improvement,Self-supervised Learning,Encoder Block,Transformer Block,Reconstruction Loss,RGB Pixel,Attention Heads,Masked Language Model,Blend Ratio,NVIDIA V100 GPU,Validation Loss
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