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BETSEE: Testing for System-Wide Effects of Single Event Effects on ITk Strip Modules

C. Belanger-Champagne,J. Dandoy,B. J. Gallop,T. C. Gosart,C. M. Helling,P. Keener,K. Krizka, B. McGovern,G. Mullier, A. -l. Poley,B. R. Roberts,C. Sawyer, A. Wall, H. Wang,M. Warren

JOURNAL OF INSTRUMENTATION（2023）

Cited 1|Views7
Key words
Radiation-hard detectors,Front-end electronics for detector readout,Digital electronic circuits
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