A Novel Data-Driven Emulator for Predicting Electromigration-Mediated Damage in Polycrystalline Interconnects
JOURNAL OF ELECTRONIC MATERIALS（2023）
关键词
Machine learning,electromigration,interconnects,microstructure emulation
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要