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On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors

Stanislav Tyaginov,Aryan Afzalian,Alexander Makarov,Geert Hellings,Alexander Grill,Michiel Vandemaele,Maksim Cherenev,Mikhail Vexler,Ben Kaczer

IEEE International Reliability Physics Symposium（2022）

Cited 0|Views12
Key words
Hot-carrier degradation,dynamically doped field-effect-transistor,interface traps,carrier transport,non-equilibrium Green functions
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