Evaluation of Electromigration Coupling Different Physics Fields in Numerical Simulation

Chongyang Cai,Jiefeng Xu,Yangyang Lai,Junbo Yang,Huayan Wang,Suresh Ramalingam,Gamal Refai-Ahmed,S. B. Park

PROCEEDINGS OF ASME 2022 INTERNATIONAL TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC MICROSYSTEMS, INTERPACK2022（2022）

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关键词

Electromigration,Finite element analysis,Multiphysics,Atomic Flux Divergence,Reliability

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