Single-Event Upset Cross-Section Trends for D-FFs at the 5- and 7-Nm Bulk FinFET Technology Nodes
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2023）
Key words
FinFETs,Transistors,Threshold voltage,Capacitance,Single event upsets,Market research,Ions,Collected charge,critical charge,feedback-loop delay (FD),FinFET,heavy ions,power consumption,single event transient (SET) pulsewidth (PW),single-event upset (SEU),threshold voltage
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