16-Term On-Wafer Calibration with Leaky Standards and Flexible Algorithm Definition
2022 52nd European Microwave Conference (EuMC)（2022）
Key words
Calibration,de-embedding,error correction,microwave on-wafer measurements,GaN HEMTs
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined