Characterization and Monitoring Platform for Single-Photon Avalanche Diodes in the Development of a Photon-to-Digital Converter Technology
2022 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS)（2022）
关键词
Single-Photon Avalanche Diodes,Wafer Probing,Photon-to-Digital Converter,Characterization and Monitoring
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