SCARLET: a Readout ASIC Bump-Bonded to SDD Array for Large Event Throughput
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）
关键词
Detectors,Throughput,Logic,Silicon,Noise,Assembly,Analog memory,Analog pulse processor (APP),bump-bonding,high-density,high-rate,pixel readout,silicon drift detector (SDD),X-ray
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