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Single Event Tolerance of X-Ray Silicon-on-insulator Pixel Sensors

Kouichi Hagino,Mitsuki Hayashida,Takayoshi Kohmura,Toshiki Doi,Shun Tsunomachi,Masatoshi Kitajima,Takeshi G. Tsuru,Hiroyuki Uchida,Kazuho Kayama,Koji Mori,Ayaki Takeda,Yusuke Nishioka,Masataka Yukumoto,Kira Mieda,Syuto Yonemura,Tatsunori Ishida,Takaaki Tanaka,Yasuo Arai,Ikuo Kurachi,Hisashi Kitamura,Shoji Kawahito,Keita Yasutomi

JOURNAL OF ASTRONOMICAL TELESCOPES INSTRUMENTS AND SYSTEMS（2022）

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Key words
Single Event Upsets
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