Read Latency Decrease Schemes Based on Check Node Error Rate for 3D NAND Flash Memories
Microelectronics Reliability(2022)
关键词
NAND flash memory,Read retry,Valley search,LDPC code,Check node error rate,Data recovery
AI 理解论文
溯源树
样例

生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要