谷歌浏览器插件
订阅小程序
在清言上使用

300 MM Wafer Laser Anneal Process Development for Applications of Multiple Process Condition in Different Zones on Single Wafer

2022 China Semiconductor Technology International Conference (CSTIC)(2022)

引用 0|浏览22
关键词
300 MM wafer laser anneal process development,multiple process condition,single wafer,technology developing,lower thermal budget,shallow junction application,implantation process,different laser annealing condition,different laser annealing parameters,implanted wafer
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要