300 MM Wafer Laser Anneal Process Development for Applications of Multiple Process Condition in Different Zones on Single Wafer
2022 China Semiconductor Technology International Conference (CSTIC)(2022)
关键词
300 MM wafer laser anneal process development,multiple process condition,single wafer,technology developing,lower thermal budget,shallow junction application,implantation process,different laser annealing condition,different laser annealing parameters,implanted wafer
AI 理解论文
溯源树
样例

生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要