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Comparison of Test Methods for Pinhole and Non-Uniform Defects in Nitrile Examination Gloves

Andy O'Brien,Seong Shan Yap,Chen Hon Nee, Chee Kin Phang, Keuw Wei Lim,Teck Yong Tou

POLYMER TESTING(2022)

Cited 1|Views10
Key words
Glove defects,Integrity,Dielectric breakdown,Leakage current,Nitrile gloves,Pinhole
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