Leveraging Root Cause Deconvolution Analysis for Logic Yield Ramping

Yan Pan,Atul Chittora,Kannan Sekar,Goh Szu Huat, You Guo Feng, Avinash Viswanatha,Jeffrey Lam

International Symposium for Testing and Failure Analysis ISTFA 2013 Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis（2013）

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