Development and Characterization of High-Quality HfO2/InGaAs MOS Interface
IntechOpen eBooks（2020）
关键词
High-k Dielectrics,CMOS Scaling,High-Performance Nanoscale Devices,Atomic Layer Deposition,Interface Engineering
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要