Performance benchmarking of p-type In<inf>0.65</inf>Ga<inf>0.35</inf>As/GaAs<inf>0.4</inf>Sb<inf>0.6</inf> and Ge/Ge<inf>0.93</inf>Sn<inf>0.07</inf> hetero-junction tunnel FETs
2016 IEEE International Electron Devices Meeting (IEDM)(2016)
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