Learning from Failures in Large Scale Soft Sensing.
2021 IEEE International Conference on Big Data (Big Data)（2021）
Key words
oversampling methods,scale soft sensing,scientific publications,soft sensing deep learning experiments,deep learning algorithms,quality control variables,wafer manufacturing process,sensor data,etching processes,focal loss,hinge loss,standard scaler,robust scaler,min-max scaler,CNN,GNN
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