Sample Size-Dependence of Thermal Evanescent Fields in Electrically Biased Graphene Devices
2021 46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz)（2021）
关键词
sample size-dependence,graphene devices,current-induced thermal evanescent fields,scanning near-field microscope,electromagnetic evanescent fields,finite element method
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