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Industrial X-Ray Inspection System with Improved Image Characterization Using Blind Deblurring Based on Compressed-Sensing Scheme

Kyuseok Kim,Soyoung Park,Guna Kim,Hyosung Cho,Uikyu Je,Chulkyu Park,Hyunwoo Lim,Hunwoo Lee,Dongyeon Lee,Yeonok Park,Taeho Woo

INSTRUMENTATION SCIENCE & TECHNOLOGY（2017）

Cited 7|Views2
Key words
Blind deblurring,compressed-sensing,nondestructive testing,x-ray inspection system
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