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Characterization of an Asymmetrical Capacitive MEMS Tilt Sensor

Y. Gao,X. Zhang,Y. Qi, H. Zhang, M. Ryutaro,Z. Jiang,X. Wei

2021 IEEE 16TH INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS (NEMS)(2021)

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Key words
MEMS,tilt sensing,asymmetrical capacitors,bias instability,temperature effect
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