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Measurement of the Beam-Normal Single-Spin Asymmetry for Elastic Electron Scattering from C12 and Al27

D. Androic,D. S. Armstrong,A. Asaturyan,K. Bartlett,R. S. Beminiwattha,J. Benesch,F. Benmokhtar,J. Birchall,R. D. Carlini,M. E. Christy,J. C. Cornejo,S. Covrig Dusa,M. M. Dalton,C. A. Davis,W. Deconinck,J. F. Dowd,J. A. Dunne,D. Dutta,W. S. Duvall,M. Elaasar,W. R. Falk,J. M. Finn,T. Forest,C. Gal,D. Gaskell,M. T. W. Gericke,V. M. Gray,F. Guo,J. R. Hoskins,D. C. Jones,M. Kargiantoulakis,P. M. King,E. Korkmaz,S. Kowalski,J. Leacock,J. P. Leckey,A. R. Lee,J. H. Lee,L. Lee,S. MacEwan,D. Mack,J. A. Magee,R. Mahurin,J. Mammei,J. W. Martin,M. J. McHugh,D. Meekins,K. E. Mesick,R. Michaels,A. Mkrtchyan,H. Mkrtchyan,A. Narayan,L. Z. Ndukum,V Nelyubin,Nuruzzaman,W. T. H. van Oers,V. F. Owen,S. A. Page,J. Pan,K. D. Paschke,S. K. Phillips,M. L. Pitt,R. W. Radloff,J. F. Rajotte,W. D. Ramsay,J. Roche,B. Sawatzky,T. Seva,M. H. Shabestari,R. Silwal,N. Simicevic,G. R. Smith,P. Solvignon,D. T. Spayde,A. Subedi,R. Subedi,R. Suleiman,V Tadevosyan,W. A. Tobias,V Tvaskis,B. Waidyawansa,P. Wang,S. P. Wells,S. A. Wood,P. Zang,S. Zhamkochyan

Physical Review（2021）

Cited 8|Views41
Key words
Secondary Electron Emission,Electron Inelastic Mean Free Paths,Beam-Induced Motion Correction,Scanning Electron Microscopy
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