Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation
2020 IEEE International Reliability Physics Symposium (IRPS)（2020）
Key words
aging,reliability,RF,power amplifier,CMOS
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined