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Measurements of Single Event Upset in ATLAS IBL

G. Balbi,M. Barbero,R. Beccherle,M. Bindi,P. Breugnon,P. Butti,D. Cinca,J. Dickinson,D. Ferrere,D. Fougeron,M. Garcia-Sciveres,J. Garcia Pascual,A. Gaudiello,C. Gemme,N. Giangiacomi,T. Hemperek,L. Jeanty,O. Kepka,M. Kocian,K. Lantzsch,P. Liu,C. Martin,A. Mekkaoui,M. Menouni,K. Potamianos,A. Rozanov,Y. Takubo,M. Wensing

Journal of instrumentation（2020）

引用 4|浏览129
关键词
Performance of High Energy Physics Detectors,Radiation damage to electronic components,Radiation-hard electronics,Si microstrip and pad detectors
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