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Bulk Defects Induced Coercivity Modulation of Co Thin Film Based on a Ta/Bi Double Buffer Layer

Xiulan Xu,Guonan Feng,Wenlin Peng,Gang Han,Chen Yang,Yunlong Jia,Risi Guo,Xiaodong Xiong,Xin He,Junfeng Luo,Qiang Hu,Lang Hu,Chun Feng,Guanghua Yu

Journal of magnetism and magnetic materials（2020）

Cited 3|Views39
Key words
Cobalt thin film,Coercive field,Microstructures,Defect
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