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The Layer-inserting Growth of Antiferromagnetic Topological Insulator MnBi$_2$Te$_4$ Based on Symmetry and Its X-ray Photoelectron Spectroscopy

Jiao Fei,Wang Jingfeng,Wang Xianyu,Tian Qingyin,Chang Meixia,Cai Lingbo,Zhu Shu,Zhang Di,Lu Qing,Wang Cao,Tan Shugang,Li Yunlong, Shanghai Jiao Tong University,Liu Bo,Qian Dong

Journal of Superconductivity and Novel Magnetism（2021）

Cited 7|Views31
Key words
MnBi2Te4,Antiferromagnetic topological insulator,XPS
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