Random Electric Field Induced by Interface Roughness in GaN/AlxGa1−xN Multiple Quantum WellsJoosun Yun,Dong-Pyo Han,Hideki HirayamaAPPLIED PHYSICS EXPRESS（2019）引用 1|浏览3AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
