Study of Edge and Screw Dislocation Density in GaN/Al2O3 Heterostructure.Vladimir Lucian Ene,Doru Dinescu,Iulia Zai,Nikolay Djourelov,Bogdan Stefan Vasile,Andreea Bianca Serban,Victor Leca,Ecaterina AndronescuMaterials（2019）引用 11|浏览6关键词gallium nitride,epitaxial thin films,defect density,edge,screw defect,slow positronsAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
