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Reciprocal Space Mapping and Strain Scanning Using X-ray Diffraction Microscopy

H. F. Poulsen,P. K. Cook, H. Leemreize,A. F. Pedersen,C. Yildirim,M. Kutsal,A. C. Jakobsen, J. X. Trujillo,J. Ormstrup,C. Detlefs

Journal of Applied Crystallography（2018）

Cited 27|Views38
Key words
X-ray diffraction microscopy,diffraction contrast tomography,structural characterization,synchrotron radiation,tomography,diffraction imaging
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